Huang, T. X., Cong, X., Wu, S. S., Lin, K. Q., Yao, X., He, Y. H., Wu, J. Bin, Bao, Y. F., Huang, S. C., Wang, X., Tan, P. H., & Ren, B.
Probing the Edge-related Properties of Atomically thin MoS2 at Nanoscale.
Nature Communications, 2019, 10(1), 4–11
https://doi.org/10.1038/s41467-019-13486-7
Keywords-Subjects:
Spectroscopy (AFM/Raman); TERS
24.05.2022