Публикации

J. J. H. Gielis, P. J. van den Oever, B. Hoex, M. C. M. van de Sanden, W. M. M. Kessels
Real-time study of a-Si:HÕc-Si heterointerface formation and epitaxial Si growth by spectroscopic ellipsometry, infrared spectroscopy, and second-harmonic generation
Physical review B 77, 205329, 2008

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28.05.2008

A.J. Fleming, K.K. Leang
Charge drives for scanning probe microscope positioning stages
Ultramicroscopy p. 1551– 1557, 2008

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27.05.2008

Ludmila Frolov, Ofer Wilner, Chanoch Carmeli, and Itai Carmeli
Fabrication of Oriented Multilayers of Photosystem I Proteins on Solid Surfaces by Auto-Metallization
Advanced materials, pp. 263-266, 2008

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15.05.2008

P. Zolotavin, E. Permenova, O. Sarkisov, V. Nadtochenko, R. Azouani, P. Portes, K. Chho, A. Kanaev. Chemical Physics Letters 457 (2008) 342–346. Two-photon luminescence enhancement of silver nanoclusters photodeposited onto mesoporous TiO2 film.

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14.05.2008

Cheol-Heon Yea, Hyunhee Kim, Jungho Kim, Sang-Uk Kim, and Jeong-Woo Choi
Fabrication of Mouse Embryonic Stem Cell Chip Using Self-Assembled Layer of Cysteine-Modified RGD Oligopeptide
Mol. Cryst. Liq. Cryst., Vol. 492, 2008

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13.05.2008

Baohua Jia, Andrew H. Norton, Jiafang Li, Adel Rahmani, Ara A. Asatryan, Lindsay C. Botten and Min Gu.
Local observation of modes from three-dimensional woodpile photonic crystals with near-field microspectroscopy under supercontinuum illumination
OPTICS LETTERS 33, 1093 (2008)

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12.05.2008

Anish Kumar, Ute Rabe, Sigrun Hirsekorn, and Walter Arnold
Elasticity mapping of precipitates in polycrystalline materials using atomic force acoustic microscopy
Applied physics letters 92, 2008

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06.05.2008

Vipin Chawla, R. Jayaganthan, A.K. Chawla, Ramesh Chandra
Morphological study of magnetron sputtered Ti thin films on silicon substrate
Materials Chemistry and Physics p. 414–418, 2008

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20.04.2008

A. A. Fraerman, B. A. Gribkov, S. A. Gusev, A. Yu. Klimov, V. L. Mironov, D. S. Nikitushkin, V. V. Rogov, S. N. Vdovichev, B. Hjorvarsson, and H. Zabel3
Magnetic force microscopy of helical states in multilayer nanomagnets
JOURNAL OF APPLIED PHYSICS 103, 073916, 2008

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19.04.2008

Joachim Loos, Alexander Alexeev
Scanning ProbeMicroscopy on Polymer Solar Cells
Applied Scanning Probe Methode X: Biomimetic and Industrial Applications, pp. 183-215, 2008

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14.04.2008

Ludmila Frolov, Yossi Rosenwaks, Shachar Richter, Chanoch Carmeli, and Itai Carmeli
Photoelectric Junctions Between GaAs and Photosynthetic Reaction Center Protein
J. Phys. Chem. C, Vol. 112, No. 35, 2008

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13.04.2008

Shaomei Yu, Feng Yan, Xingwang Zhang, Jingbi You, Peiyi Wu, Jianmei Lu, Qingfeng Xu, Xuewei Xia, and Guilin Ma
Polymerization of Ionic Liquid-Based Microemulsions: A Versatile Method for the Synthesis of Polymer Electrolytes
Macromolecules 2008, 3389-3392

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02.04.2008

H. Fisher, A. Nesci, G. Leveque & O. J.F. Martin.
Characterization of the polarization sensitivity anisotropy of a near-field probe using phase measurements.
Journal of Microscopy, pp. 27–31, 2008

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01.04.2008

Tsung-Ying Ke, Hsiang-An Chen, Hwo-Shuenn Sheu, Jien-Wei Yeh, Heh-Nan Lin, Chi-Young Lee, and Hsin-Tien Chiu
Sodium Niobate Nanowire and Its Piezoelectricity
J. Phys. Chem. C, 112, pp. 8827–8831, 2008

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27.03.2008

В.М. Грабов, Е. В. Демидов, В.А. Комаров.
Атомно-силовая микроскопия пленок висмута.
Физика твердого тела, 2008, том 50, вып. 7.

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19.03.2008

F. V. Tikhonenko, D. W. Horsell, R. V. Gorbachev, and A. K. Savchenko
Weak localization in graphene flakes.
arXiv:0707.0140v2 [cond-mat.mes-hall] 11 Jan 2008

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16.03.2008

A. Alexeev, J. Loos
Conductive atomic force microscopy (C-AFM)analysis of photoactive layers in inert atmosphere.
Organic Electronics 9 (2008)

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16.03.2008

Anand I. Bhatt, Alan M. Bond
Electrodeposition of silver from the ‘distillable’ ionic liquid, DIMCARB in the absence and presence of chemically induced nanoparticle formation
Journal of Electroanalytical Chemistry , 2008

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16.03.2008

W. WANG, P. CISELLI, E. KUZNETSOV, T. PEIJS, A. H. BARBER.
Effective reinforcement in carbon nanotube–polymer composites.
Published online

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16.03.2008

Ю. М. Стрючкова, Э.В. Касаткин
Исследование наноструктуры и поверхостных энергетических свойств нержавеющей стали X18H10T методами электрохимической сканирующей туннельной микроскопии и сканирующей туннельной спектроскопии. 2. Измерения при различных потенциалах образца в растворах HCI и H₂SO₄
Физикохимия поверхности и защита материалов, 2008, том 44, N6 с. 620-626.

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13.03.2008

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