+1-480-493-0093
Yu.A. Filimonov, A.S. Dzhumaliev, A.V. Kozhevnikov, S.L. Vysotsky.
Influence of growth temperature on the easy magnetization axis switch and domain structure in Fe=Ga/As(100) structures.
Journal of Magnetism and Magnetic Materials 272–276 (2004) e937–e939
Jaroslaw Drelich, Garth W. Tormoen, Elvin R. Beach.
Determination of solid surface tension from particle–substrate pull-off forces measured with the atomic force microscope.
Journal of Colloid and Interface Science 280 (2004) 484–497
A. Levent Demirel, Mustafa Degirmenci, Yusuf Yagcэ.
Atomic force microscopy investigation of asymmetric diblock copolymer morphologies in thin films.
European Polymer Journal 40 (2004) 1371–1379
S. Nishio, M. Yoshidome, H. Uji-i, J. Hobley, H. Fukumura, and K.A. Zachariassey.
Structure of Intermolecular Donor–Acceptor Monolayers of N,N-Dimethyl-p-[15-(1-pyrenyl)pentadecanyl]aniline.
Chemistry Letters Vol.33, No.11 (2004).
A.K. Dua, M. Roy, J. Nuwad, V.C. George, S.N. Sawant.
Enhanced nucleation and post-growth investigations on HFCVD diamond films grown on silicon single crystals pretreated with Zr:diamond mixed slurry.
Applied Surface Science 229 (2004) 254–262
S.V. Gastev, K.R. Hoffman, A.K. Kaveev, R.J. Reeves, N.S. Sokolov.
Laser spectroscopy of epitaxial manganese and zinc fluoride films on silicon.
Journal of Crystal Growth 268 (2004) 536–542
A.I. Vilensky, D.L. Zagorski, P.Yu. Apel, N.V. Pervov, B.V. Mchedlishvili, V.N. Popok, N.N. Mel'nik.
Thermal regression of latent tracks in the polymer irradiated by high energy heavy ions.
Nuclear Instruments and Methods in Physics Research B 218 (2004) 294–299
Ching-Chou Wu, Hsien-Chang Chang.
Estimating the thickness of hydrated ultrathin poly(o-phenylenediamine) film by atomic force microscopy.
Analytica Chimica Acta 505 (2004) 239–246
N.V. Maluchenko, I.I. Agapov, A.G. Tonevitsky, M.M. Moisenovich, M.N. Savvateev, E.A. Tonevitsky, V.A. Bykov, M.P. Kirpichnikov.
Detection of immune complexes using atomic force microscopy.
Biofizika, 2004 Nov-Dec;49(6):1008-14. Russian.
N.V. Maluchenko, I.I. Agapov, A.G. Tonevitsky, M.M. Moisenovich, M.N. Savvateev, E. A. Gudim, V.A. Bykov, M.P. Kirpichnikov.
Quantitative analysis of complexes formation between IgM and immobilized ligand using atomic force microscopy.
Biofizika, 2004 Nov-Dec; 49(6):1015-20.
G.B. Khomutova, R.V. Gainutdinov, S.P. Gubin, V.V. Kislov, V.V. Khanin, A.A. Rakhnyanskaya, A.N. Sergeev-Cherenkov, E.S. Soldatov, D.B. Suyatin, I.V. Taranov, A.L. Tolstikhina.
Organized planar nanostructures from ligand-stabilized nanoclusters: a route to molecular nanoelectronic devices.
Applied Surface Science 226 (2004) 149–154
F. Patolsky, Y. Weizmann, I. Willner. Long-Range Electrical Contacting of Redox
Enzymes by SWCNT Connectors.
Angew. Chem. Int. Ed. 2004, 43, 2113 –2117
A.S. El-Said, M. Cranney, N. Ishikawa, A. Iwase, R. Neumann, K. Schwartz, M. Toulemonde, C. Trautmann.
Study of heavy-ion induced modifications in BaF2 and LaF3 single crystals.
Nuclear Instruments and Methods in Physics Research B 218 (2004) 492–497
Marina Alloisio, Silvia Sottini, Pietro Riello, Emilia Giorgetti, Giancarlo Margheri, Carla Cuniberti, Giovanna Dellepiane.
AFM, SEM and GIXRD studies of thin films of red polycarbazolyldiacetylenes.
Surface Science 554 (2004) 68–75
S. N. Pleskova, Yu. Yu. Guschina, M. B. Zvonkova.
Investigation of the influence of complement system on the various strains of Proteus by methods of atomic force microscopy and luminol-dependent chemiluminescence.
Phys. Low-Dim. Struct., Ѕ (2004) pp. 77-82
A. Yu. Kasumov, D. V. Klinov, P.-E. Roche, S. Gueron, and H. Bouchiat. Thickness and low-temperature conductivity of DNA molecules. Appl.Phys.Lett. 84, 2004, 1007-1009.
S.I. Bozhko, A.N. Chaika, G.A. Emelchenko, V.M. Masalov, A.M. Ionov, A.N. Gruzintsev, G.M. Mikhailov, B.K. Medvedev.
Mono- and multilayered opalline superlattices: application to nanotechnology of 2D ordered array of nanoobjects and 3D metalattices.
Applied Surface Science 234 (2004) 93–101
Jui-Chin Chen, Wen-Ta Tsai.
Chemical–mechanical polishing behavior of tantalum in slurries containing citric acid and alumina.
Surface & Coatings Technology 185 (2004) 50– 57
