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A. Kirsanov, A. Kiselev, A. Stepanov, N. Polushkin. Nanoproccessing in the Near-Field
of Atomic Force Microscope Tip by Femtosecond Laser Pulses. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 69.
Victor A. Bykov. From scanning probe microscopes to smart nanotechnology complexes. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 74.
A. A. Bukharaev, D.A. Biziaev, P. A. Borodin. Investigation of conductive properties of micro- and nanowires using scanning probe microscopy. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 111.
Lemeshko S.V. Saunin S.A. Roschin V.M. Yalovenko A. Y. The physical-chemical model of the tip-induced oxidation process on thin metal films, factors influencing and improvement of the lateral resolution. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 81.
B.N. Zaitsev. Atomic Force Microscopy in Applied Biological Research. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 87.
S. Saunin, S. Leesment. AFM investigation of the silicon micro structure steep walls
created by reactive ion milling. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. p. 88.
Yu.N.Drozdov, V.M.Danil’tsev, N.V.Vostokov, G.L.Pakhomov, V.I.Shashkin. Cross-sectional AFM of GaAs-based multilayer heterostructure with thin AlAs marks. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 94.
L. A. Fomin, I.V. Malikov, G.M. Mikhailov. The research of magnetic-contrast size-dependence in epitaxial iron nanostructures. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 126.
O.V.Karban, O.L.Khasanov. Investigation of ZrO2 Nanoceramics Microstructure. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 128.
A.E. Muravyev, S.S. Mikhailova, O.A. Shilova and O.M. Kanunnikova. AFM investigation of Pt-doped spin-on glass thin silica films. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 131.
Lomayeva S.F., Lomayev I.L. Application of AFM and XPS in measuring thickness of surface coatings for nanostructured materials. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 140.
Gaponov S.V., Gribkov B.A., Mironov V.L., Treskov S.A., Volgunov D.G. AFM investigations of nanometer-scale metal clusters formation on silicon surface. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 166.
A.G. Temiryazev, V.I. Borisov, A.I. Krikunov, M.P. Tikhomirova. Domains in micron-sized permalloy elements. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 158
A.G. Temiryazev. MFM study of soft magnetic samples. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 161.
V.F.Dryakhlushin, A.Yu.Klimov, V.V.Rogov, N.V.Vostokov. Fabrication of the Nanodimensional Elements by the Near-Field Optical Lithography Method. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 177.
Igor V.Dushkin, Alexey V.Mezin. SNOM Lithography on positive photoresist. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 204.
Bykov V.A., Saunin S.A., Volkov A.D., Efimov A.E., Komkov V.N. Integrated Approach to Software Environment for Nanotechnology. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 215.
A.V. Zhikharev, S.G. Bystrov. Auxiliaries for scanning probe microscopes. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 240.
G.V.Dedkov, R.I. Teghaev, A. Kh. Tutukov, O.A. Dyshekov. TEM imaging of tip-sample contacts between
microfabricated silicon tips and copper surface. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 253.
A.Alexeev, S.Saunin, V.Zhizhimontov, M.Zhdanov, J.Loos, U.S.Schubert. The use of automated afm for studying of polymers. SPM-2003, Proceedings. Nizhni Novgorod, March 2-5. 2003. P. 256.
