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V. N. Bessolov, Yu. V. Zhilyaev, E. V. Konenkova, S. A. Kukushkin, A. V. Luk'yanov, S. D. Raevski , and V. A. Fedirko. Initial Stages of the GaN Growth on Oxidized Silicon Techn. Phys. Lett. 27, 1010 (2001).
S. S. Kosolobov, A. L. Aseev, A. V. Latyshev. In Situ Study of Interaction of Oxygen with the Si(111) Surface by Ultrahigh-Vacuum Reflection Electron Microscopy. Semiconductors, 35, 1038 (2001).
A.V. Latyshev, S.S. Kosolobov, D.A. Nasimov, V.N. Savenko, A.L. Aseev. Atomic steps on the single crustal surface during epitaxy, sublimation and gas reaction. Journal of Japanese Association of Crystal Growth, in press.
V.M.Danil’tsev, M.N.Drozdov, Yu.N.Drozdov, O.I.Khrykin, V.I.Shashkin, I.Yu.Shuleshova, N.V.Vostokov. IPM RAS. Nizhny Novgorod, Russia. New approach to AFM investigation of buried Al/InGaAs/GaAs interfaces and quantum dots. Phys. Low-Dim. Struct. 3/4, 321 (2001).
N. V. Vostokov, D. M. Gaponova, V. M. Daniltsev, Yu. N. Drozdov, O. I. Khrykin,V. Murel, V. I. Shashkin, I. Yu. Shuleshova. "Investigation of InGaAs Based Double - Quantum Well Heterostructures Near the Critical Thickness Transition."//Physics of Low-Dimensional Structures, 3/4 (2001), pp. 303-307.
A.M.Dorfman, A.M.Lyakhovich, S.G.Bystrov, V.L.Povstugar. Physical-Technical Institute UrB RAS. Izhevsk, Russia. Surface structure and characteristics of plasma – polymerized geptane investigated by means of probe microscopy. Phys. Low-Dim. Struct. 3/4, 277 (2001).
S.F.Lomayeva, O.M.Kanunnikova, V.I.Povstugar . Physical-Technical Institute UrB RAS. Izhevsk, Russia. AFM-and XPS-investigations of surface layers of nanocrystalline alloy FeSiBNbCu. Phys. Low-Dim. Struct. 3/4, 271 (2001).
S.G.Bystrov, V.I.Povstugar, S.S.Mikhailova, B.V.Mtchedlishvilly, A.N.Netchayev, D.L.Zagorsky. The AFM and XPS Investigation of the Surface of Polyethylene Terephthalate Irradiated by High Energy Ions.Phys. Low-Dim. Struct. 3/4, 257 (2001).
G.L.Pakhomov, V.R.Zakamov, V.L.Mironov, N.V.Vostokov. AFM Study of Ion Irradiated Metal Phthalocyanine Films. Phys. Low-Dim. Struct. 3/4, 199 (2001).
O.V.Сarban, S.G.Bystrov, E.I.Salamatov, A.V.Zhikharev. Image Contrast in the Lateral Force Mode on Multiphase Materials. Phys. Low-Dim. Struct. 3/4, 31 (2001).
V.A.Bykov, S.G.Feklisov, S.A. Saunin. Application of Spectral Technique in the Scanning Probe Microscopy. SFOM (Scanning Fluorescence Optical Microscope). Phys. Low-Dim. Struct. 3/4, 25 (2001).
A.M.Alexeev, V.M.Anishchik, G.Yu.Akulov, V.A.Bykov, V.V.Grushevskii, G.K.Ilyich, L.V.Kukharenko, G.V.Krylova. Morphology of the Dithionylpyrrole Langmuir-Blodgett Films and their AFM Modification. Phys. Low-Dim. Struct. 3/4, 1 (2001).
A. M. Alekseev, Yu. K. Verevkin, N. V. Vostokov, V. N. Petryakov, N. I. Polushkin, A. F. Popkov, and N. N. Salashchenko. Observation of Laser-Induced Local Modification of Magnetic Order in Transition Metal Layers. JETP Lett. 73, 192 (2001).
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A.I.Vilensky, O.G. Larionov, R.V. Gainutdinov, A.L. Tolstikhina, V.Ya. Kabanov, D.L. Zagorski, E.V. Khataibe, A.N. Netchaev, B.V. Mchedlishvili. The heavy ions tracks in polymers investigation by means of high-effective liquid chromatography and atomic-force microscopy. Radiation Measurements 34, 75 (2001).
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N.I. Nurgazizov, A.A. Bukharaev, A.V. Sugonyako, V.A. Zhykharev. AFM Investigation of Radiation Damage Distribution in Implanted Silicon Oxide. Phys.Low-Dim. Struct. 3/4, 97 (2001).
D.V Ovchinnikov, А.А. Bukharaev, P.A Borodin., D.A. Biziaev. In situ MFM Investigation of Magnetizatin reversal in Co Patterned Microstructures. Phys.Low-Dim. Struct. 3/4, 103 (2001).
A. L. Stepanov, V. N. Popok, D. E. Hole, A. A. Bukharaev. Interaction of High-Power Laser Pulses with Glasses Containing Implanted Metallic Nanoparticles. Phys. Sol. St. 43, 2192 (2001).