D. V. Ovchinnikov, A. A. Bukharaev. Computer Simulation of Magnetic Force Microscopy Images with a Static Model of Magnetization Distribution and Dipole–Dipole Interaction. Techn. Phys. 46, 1014 (2001).
A.L. Stepanov, D.E. Hole, А.А. Bukharaev. Interaction of high-power excimer-laser pulses soda-lime silicate glass containing ion-implanted metal nanoparticles. Vacuum 64, 169 (2001).
А.А. Bukharaev, N.I. Nurgazizov, A.A. Mozhanova, D.V Ovchinnikov. AFM investigation of selective etching mechanism of nanostructured silica. Surf. Sci. 482-485, 1319 (2001).
A.Ankudinov, V.Marushchak, A.Titkov, V.Evtikhiev, E.Kotelnikov, A.Egorov, H.Riechert, H.Huhtinen, R.Laiho. Fine structure of the inner electric field in semiconductor laser diodes studied by EFM. Phys. Low-Dim. Struct. 3/4, 9 (2001).
A. V. Ankudinov, E. Yu. Kotel'nikov, A. A. Kantsel'son, V. P. Evtikhiev, and A. N. Titkov. Cross-Sectional Electrostatic Force Microscopy of Semiconductor Laser Diodes. Semiconductors 35, 840 (2001).
Y.-R. Ma, C.-H. Chueh, W.-L. Kuang, Y. Liou, Y.-D. Yao. Magnetic force microscopy study of La0.7Sr0.3MnO3/Si(001) around its Curie temperature. Journal of Magnetism and Magnetic Materials, 2001.
Y.-R. Ma, C. Yu, Y.-D. Yao, Y. Liou, and S.-F. Lee. Tip-induced local anodic oxidation on the native SiO2 layer of Si(111) using an atomic force microscope. Physics Review B, 2001, Volume 64, pp. 195324.
H. Uji-i, K. Hatanaka, J. Hobley, and H. Fukumura.
Nanospark at the interface between organic solvents and tin-doped indium oxide.
APPLIED PHYSICS LETTERS VOLUME 79, NUMBER 16.
V.N. Konopsky, K.E. Kouyanov, N.N. Novikova. Investigations of the interference of surface plasmons on rough silver surface by scanning plasmon near-field microscope. Ultramicroscopy, 2001, Vol.88, pp. 127–138.
Rostislav V. Lapshin.
Digital data readback for a probe storage device.
REVIEW OF SCIENTIFIC INSTRUMENTS VOLUME 71, NUMBER 12, pp. 4607-4610, 2000
Konopsky V.N. Operation of scanning plasmon near-field microscope with gold and silver tips in tapping mode: demonstration of subtip resolution. Optics Communications, 2000, Vol. 185, pp. 83-93.
V.N. Konopsky .
Operation of scanning plasmon near-feld microscope with gold and silver tips in tapping mode: demonstration of subtip resolution.
Optics Communications 185 (2000) 83-93.
Yu.M. Yevdokimov, V.I. Salyanov, B.M. Mchedlishvili, V.A. Bykov, A.V. Belyaev, S.A. Saunin, F. Spener, M. Palumbo. Double-stranded nucleic acids in liquid-crystalline dispersions as building blocks for cross-linked supramolecular structures. Nucleosides, Nucleotides & Nucleic Acids, 19, 1355 (2000).
E.A. Mazurina, I.V. Myagkov, S.V. Ayrapetiants, V.V. Losev, A.T. Dembo. Mono- and multilayers from heptadecylcarboxy-tetrathiofulvalen modified by the surface-inactive electron acceptors. Molecular Materials, 2000, Vol. 12, pp. 27-43.
V.R. Novak, V.V. Zhizhimontov, A.V. Belyayev, V.A. Bykov. Surface Morphology of Arachidic Acid – Cd Arachidate Lb-Films Studied with SFM. Molecular Materials, 2000, Vol. 12, pp. 111-123.
A. Kikuieshi, V. Palyok, M. Slliplyak, I.A. Szabo, D.L. Beke. Photo-induced surface deformation during hologram recording in a-Se films. Journal of Optoelectronics and Advanced Materials, Vol. 2, No. 1, March 2000, pp. 95-98.
L. M. Blinov, V. M. Fridkin, S. P. Palto, A. V. Bune, P. A. Dowben, S. Ducharme. Two-Dimensional Ferroelectrics (Review). Physics progress, Mart 2000, Volume 170, Issue 3, pp. 245-262.
Л.М. Блинов, В.М. Фридкин, С.П. Палто, А.В. Буне, П.А. Даубен, С. Дюшарм. Двумерные сегнетоэлектрики (Обзор актуальных проблем). Успехи физических наук, Март 2000 г, том 170, №3, стр. 245-262.
Michael D. Garrison, Todd C. McDevitt, Reto LuginbuK hl, Cecilia M. Giachelli, Pat Stayton, Buddy D. Ratner.
Quantitative interrogation of micropatterned biomolecules by surface force microscopy.
Ultramicroscopy 82 (2000) 193-202
V.A. Bykov, S.V. Lemeshko, S.A. Saunin. Local oxidation of the surface of the semi-conductors and metals solid-state probe SPM in the semicontact mode scanning as perspective method of the creation of the elements nanoelectronics. Materials of the All-Russian conference "Probe microscopy - 2000". Nizhni Novgorod, 28 february -5 mart 2000, IPN RAS, pp. 308-314.
В.А. Быков, С.В. Лемешко, С.А. Саунин. Локальное окисление поверхности полупроводников и металлов твердотельным зондом СЗМ в режиме полуконтакт-ного сканирования как перспективный метод создания элементов наноэлектроники. Материалы всероссийского совещания "Зондовая микроскопия - 2000". Нижний Новгород, 28 февраля - 2 марта 2000г, ИФН РАН, cтр. 308-314.